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Testing Capability |
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MIX Mode /Logic/Memory Tester |
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Tester/Model |
Max Pins |
Vector Memory |
Speed(Mhz) |
Analog Option |
| Teradyne/J750 |
384 |
8M |
100 |
MSIO |
| Credence/D10 |
384 |
16M |
100 |
Qual AWG/Qual Digitizer |
| Credence/SC312,Scu |
256 |
4M |
50 |
APE |
| Credence/Kalos-16 |
16*48 |
1M |
50 |
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| Agilent/V50 |
256 |
17M |
50 |
MIX board |
| VTT/V7100 |
128 |
1M/4M |
10 |
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Analog Tester |
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Tester/Model |
Characteristic |
Device |
| Shibasoku/WL-25 |
linear tester |
Audio amplifier,Motor Driver |
| Credence/ASL1000 |
linear tester |
DDRII Regulater,Power Switch,PWM,Thermal Device,Inverter |
| Amida/AT1000 |
linear tester |
PWM,LDO |
| Tesec/881 |
MOSFET tester |
MOSFET,BJT |
| Spandnix/SX1300 |
linear tester |
Li-Battery Protect,DC to DC converter,LDO,PWM |
| CATS/CARG-04M/10M |
Regulater tester |
Regulater,Detecter |
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Handeler/Model |
Spec. |
Notes |
| MCT/3608E |
P-DIP 600 mil |
Ambient |
| SemiJess/JP-400 |
P-DIP 300/600 mil |
Ambient |
| SemiJess/JS-200/400 |
SOP 150/300 mil SSOP 209/300 mil |
Ambient |
| SemiJess/JS-630H |
SOP 150/236 mil SSOP 150/209 mil TSSOP 240 mil |
Ambient |
| SemiJess/JT-200 |
TO-92/3,TO-92/4,TO251/252/260/263 |
Ambient |
| SemiJess/JT400 |
SOT-89,SOT-223 |
Ambient |
| MulTitest/MT-8589 |
PLCC 32/44 |
Ambient & Hot |
| MulTitest/MT-9308 |
SOP 150/300 mil |
Ambient & Hot |
| MulTitest/MT-9320 |
MSOP,SSOP 150/209 mil,TSSOP 173 mil |
Ambient & Hot |
| MulTitest/MT-9928 |
MSOP,SOP/SSOP 150 mil,TSSOP 173/240 mil |
Ambient & Hot |
| SeikoEpson/NS-5000/6000 |
TQ/LQ/PQ FP 7X7~24X24 by C.O.K |
Ambient & Hot |
| SeikoEpson/NS-6000/8000 |
TQ/LQ/PQ FP , QFN 4X4 ~ 9X9 by C.O.K |
Ambient & Hot |
| RASCO/RA-1000 |
TSSOP 173 mil |
Ambient & Hot |
| TROPAD /TR-1000 |
SOT 23/3L,5L,8L |
Ambient |
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Prober/Model |
Spec. |
TELS-19S |
4"- 6" |
TSK-UF200 |
5"-8" |
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