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Wafer Testing->Mixed signal & logic tester |
Greatek provides customers the tester and equipment to satisfy your logic/mixed signal application requirements. Here you can find our current list of testers and equipment.
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| Mixed Signal & Logic Tester |
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ADVANTEST V93000 |
Teradyne/J750 |
Chroma 3650 |
Chroma 3380P |
Sandtek/S100 |
Sandtek/S50 |
| Test Rate |
100Mbps to 1600Mbps |
100 MHZ |
100 HMZ |
100 HMZ |
100 MHZ |
50 MHZ |
| Parallel Testing Capability |
32 SITE |
24 SITE |
32 SITE |
32 SITE |
32 SITE |
8 SITE |
| IO Channel |
PS1600 512 channels |
512 PIN |
512 PIN |
512 PIN |
256-768 PIN |
256 PIN |
| DPS Source |
DPS128 256 channels |
24 set |
32 set |
32 set |
16 - 48 set |
8 set |
| Pattern Memory |
16MB to 32MB |
16 M |
16/32 M |
32 M |
32 M |
16 M |
| Mix Mode Option |
NA |
MSIO |
AD/DA |
NA |
Mix-Board |
Mix-Board |
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Wafer Testing
